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ATPG efficiency is another important consideration that is influenced by the fault model under consideration, the type of circuit under test (full scan,atpg slot It creates & embeds the test compression logic into the design It further extends ATPG to generate compressed test patterns & reduces the test

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atpg slot Let us explore the most prevalent DFT approach for logic testing, known as Scan and ATPG in VLSI Click to read more